LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for fabricating curved crystal x-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for film thickness measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for generating small size,...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for improved x-ray reflection measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for in-process analysis of polycrystalline

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for labeling using optical...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for line-modified asymmetric crystal topogr

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for liquid safety-detection by...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for liquid safety-detection by...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for making parallel X-ray beam and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for measuring density

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for measuring thickness of coating...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for measuring thickness of paint layers on

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for measuring thin film, and thin film...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for obtaining simultaneously absorption...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for orienting a crystalline body during...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for producing monochromatic radiography wit

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for quantitative phase analysis of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for simultaneous phase composition and resi