X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-05-16
1992-09-15
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 7170, G01N 2320
Patent
active
051484587
ABSTRACT:
It is often important to measure the phase composition and residual stress resultant from many materials processing procedures. For example, the carburization and heat treatment of steel components where the phase content of austenite versus ferrite or martensite, and residual stress are important characteristics with respect to the ultimate performance of the component. The x-ray diffraction techniques are used extensively to measure both of these characteristics of steel parts. However, the procedures for these measurements are time consuming and must be performed sequentially with any x-ray instrument except that of the present invention. This invention describes a method and apparatus that is able to perform the measurement of retained austenite and residual stress simultaneously. The advantages that the invention offers include very short measurement times and measurement of the characteristics in exactly the same spot of a sample at the same time.
REFERENCES:
patent: 3402291 (1968-09-01), Weinman
patent: 3427451 (1969-02-01), Spielberg
patent: 3868506 (1975-02-01), Ogiso
patent: 3934138 (1976-01-01), Bens
Greer, Jr. Thomas J.
Howell Janice A.
Wong Don
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