Method and apparatus for line-modified asymmetric crystal topogr

Details Method and apparatus for line-modified asymmetric crystal topogr Method and apparatus for line-modified asymmetric crystal topogr

1989-03-24

1990-05-22

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 84, G01N 2320

Patent

active

049282948

ABSTRACT:
An improved asymmetric crystal topography x-ray imaging system employing a ine focus horizontal line source of x-rays and a crystal monochromator used in a compression mode. Relatively large horizontal and vertical dimensions of the monochromating crystal allow imaging of larger areas of imperfect crystals than previously possible, without adversely affecting image resolution. The high resolution two-dimensional images are a direct consequence of our method of controlling the probe beam divergences. An appreciably enhanced and useful intensity of monochromatic x-rays is obtained over that available with prior asymmetric crystal topography systems.

REFERENCES:
patent: 3982127 (1976-09-01), Hartmann et al.

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