X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1997-06-09
1999-06-15
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
379 49, 379 83, 379 85, G01T 136
Patent
active
059129409
ABSTRACT:
A combination wavelength and energy dispersive x-ray spectrometer comprising a point source of isotropic x-rays, a collimator to collect a large flux of x-rays and to redirect them into a substantially parallel beam, dispersing element means having a plurality of diffracting surfaces to reflect and diffract the parallel beam of x-rays into its component wavelength spectrum, controller means to alter the orientation of the dispersing element relative to the beam of x-rays, position tracking means to identify the orientation of the dispersing element and to provide data output, detector means to receive the reflected beam and to quantify its energy spectrum, wavelength spectrum and to provide data output, data display means to exhibit and record the output provided.
REFERENCES:
patent: 3920984 (1975-11-01), Kirkendall
patent: 4131794 (1978-12-01), Bruninx
patent: 4472825 (1984-09-01), Jenkins
patent: 4796284 (1989-01-01), Jenkins
LandOfFree
Combination wavelength and energy dispersive x-ray spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Combination wavelength and energy dispersive x-ray spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Combination wavelength and energy dispersive x-ray spectrometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-407726