X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-01-30
1992-06-23
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 89, 378145, 250308, G01N 23203
Patent
active
051250179
ABSTRACT:
A Compton x-ray backscatter gage apparatus directing x-rays from an isotopic radiation source to a region of interest in a composite structure to monitor structural integrity. The backscattered x-rays from the region of interest are directed by guides in the gage housing to radiation detectors.
REFERENCES:
patent: 4047029 (1977-09-01), Allport
patent: 4258256 (1981-03-01), Harding
patent: 4268753 (1981-05-01), Murakami et al.
patent: 4277686 (1981-07-01), Harding
patent: 4582993 (1986-04-01), Bhattacharya et al.
patent: 4688240 (1987-08-01), Hosemann et al.
patent: 4825454 (1989-04-01), Annis et al.
Howell Janice A.
Porta David P.
Singer Donald J.
Stephanishen William
The United States of America as represented by the Secretary of
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