X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1990-11-19
1991-10-01
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, G01B 1502
Patent
active
050540432
ABSTRACT:
A cable insulation eccentricity and diameter monitor comprises a revolving structure mounted coaxially with the cable, a finely collimated source of gamma particles mounted on such revolving structure for generating a beam of gamma particles, a radiation detector fixed to the revolving structure for detecting the gamma particles scattered from such beam by the cable and for generating pulses the amplitude of which is dependent on the energy of the scattered gamma particles reaching the detector, first drive means for moving the source of gamma particles so as to direct the beam at predetermined target positions corresponding to probable conductor and cable/atmosphere boundaries of the cable along a first axis perpendicular to the axis of the cable, second drive means for repositioning the revolving structure to move the source of gamma particles and the radiation detector to a position around the cable so as to direct the beam at target positions corresponding to probable conductor and cable/atmosphere boundaries along a second axis perpendicular to the axis of the cable, a pulse height analyzer responsive to the detector for detecting and counting the pulses produced by the detector within a preset range of pulse height, and a computer responsive to the output of the pulse height analyzer and to test data stored in its memory for operating the first and second drive means to find the actual location of such boundaries and for computing insulation eccentricity and diameter of the cable from such findings.
REFERENCES:
patent: 3148279 (1964-09-01), Skala
Hintze Frank W.
Lucas John M.
Canada Wire and Cable Limited
Church Craig E.
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