Combination of X-ray diffractometer and solid state detector and

Details Combination of X-ray diffractometer and solid state detector and Combination of X-ray diffractometer and solid state detector and

1993-08-02

1995-07-11

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 73, G01N 23207

Patent

active

054328322

ABSTRACT:
A combination of X-ray diffractometer and solid state detector is much faster than previous diffractometers and detectors in that X-ray photons that impinge on the detector do not have to be counted in the single photon counting mode.

REFERENCES:
patent: 4686631 (1987-08-01), Ruud
patent: 4972448 (1990-11-01), Munekawa

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