X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-04-11
2010-06-22
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Reexamination Certificate
active
07742567
ABSTRACT:
One aspect relates to locating an at least one scattering event at least partially within an at least some matter of an at least a portion of an individual at least partially by directing an at least one pulse-type applied X-ray at the at least some matter of the at least the portion of the individual to create an at least one corresponding pulse-type Compton scattered X-ray, wherein the locating the at least one scattering event is based at least in part on an at least one time of flight computation derived at least in part from a combination of an at least one applied duration and an at least one scattered duration, wherein the at least one applied duration corresponds to a time for the at least one pulse-type applied X-ray to reach the at least one scattering event within the at least some matter of the at least the portion of the individual, and further wherein the at least one scattered duration corresponds to a time for the at least one corresponding pulse-type Compton scattered X-ray to thereupon travel from the at least one scattering event within the at least some matter of the at least the portion of the individual to be detected.
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Boyden Edward S.
Hyde Roderick A.
Ishikawa Muriel Y.
Jung Edward K. Y.
Leuthardt Eric C.
Searete LLC
Thomas Courtney
LandOfFree
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