Built-in testing methodology in flash memory

Burn in system and method for improved memory reliability

Burn in system and method for improved memory reliability

Burn-in checking apparatus for semiconductor memory device

Burn-in circuit and method therefor of semiconductor memory devi

Burn-in detection circuit

Burn-in stress circuit for semiconductor memory device

Burn-in stress control circuit for a semiconductor memory device

Burn-in test circuit

Burn-in test circuit and method in semiconductor memory device

Burn-in test circuit for semiconductor memory device

Burst access memory system

Burst EDO memory device having pipelined output buffer

Burst EDO memory device with maximized write cycle timing

Burst refresh of dynamic random access memory for personal compu

Burst-mode DRAM

Bus driving circuit and memory device having same

Bus driving circuit and memory device having same

Bus driving circuit and memory device having same

Bus interface circuit and receiver circuit