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Method for testing semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Method for testing semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method for testing the serviceability of bit lines in a DRAM...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Method for the erasure of memory cells, device designed to imple

Static information storage and retrieval – Read/write circuit – Erase
Patent

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Method for the programming of an anti-fuse, and associated...

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Method for the testing of a dynamic memory

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method for the testing of electrically programmable memory cells

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method for the testing of one time programmable memories and cor

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method for tracking metal bit line coupling effect

Static information storage and retrieval – Read/write circuit – Including signal comparison
Reexamination Certificate

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Method for training dynamic random access memory (DRAM)...

Static information storage and retrieval – Read/write circuit – Signals
Reexamination Certificate

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Method for transparent updates of output driver impedance

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Method for two-cycle sensing in a two-terminal memory array...

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Method for using two data busses for memory array block...

Static information storage and retrieval – Read/write circuit – Simultaneous operations
Reexamination Certificate

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Method for vertical fuse testing

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method for wear leveling in a flash EEPROM memory

Static information storage and retrieval – Read/write circuit – Erase
Patent

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Method for writing data bits to a memory array

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit
Reexamination Certificate

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Method for writing data in testing memory device and circuit for

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Method for writing data into memory and the control device

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Method for writing to multiple banks of a memory device

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Method for writing to multiple banks of a memory device

Static information storage and retrieval – Read/write circuit – Testing
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