Method for testing semiconductor memory device

Details Method for testing semiconductor memory device Method for testing semiconductor memory device

2008-02-22

2010-10-12

Nguyen, VanThu (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S200000, C714S718000

Reexamination Certificate

active

07813195

ABSTRACT:
A method for testing a semiconductor memory device is provided. The semiconductor memory device includes a plurality of word lines, a plurality of bit lines, and a plurality of memory cells. Each word line is controlled by a corresponding control line and a corresponding driving line. The method includes selecting a plurality of word lines controlled by one driving line; enabling a plurality of control lines respectively corresponding to the selected word lines; actuating one of the selected word lines; and adding a disturbing signal on the actuated word line and measuring signals on the plurality of bit lines.

REFERENCES:
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patent: 5638331 (1997-06-01), Cha et al.
patent: 6574159 (2003-06-01), Ohbayashi et al.
patent: 6658609 (2003-12-01), Saito et al.
patent: 6691252 (2004-02-01), Hughes et al.

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