Method for vertical fuse testing

Details Method for vertical fuse testing Method for vertical fuse testing

1989-03-07

1990-11-06

Popek, Joseph A.

Static information storage and retrieval

Read/write circuit

Testing

3652257, 365 96, G11C 1716

Patent

active

049691244

ABSTRACT:
A method and structure is provided to test for leakage currents in a fuse array. A diode is connected to each column in the array in order to isolate the column from the test circuitry during normal operation of the device. During testing, current is fed through a diode to a column, and the corresponding leakage current is measured. In one embodiment, the anodes of each diode are connected in common to a single test point, and the total leakage current from the entire fuse array is measured simultaneously. In another embodiment, addressing means are used to selectively address a desired one of the test diodes and thus a corresponding one of the columns such that leakage current through a single column. In another embodiment, regardless whether all of the columns are simultaneously accessed or are addressed individually, rows are individually addressed in order to enable measurement of leakage current of either a single fuse, or the total leakage current of the fuses associated with an entire row, respectively.

REFERENCES:
patent: 3848238 (1974-11-01), Rizzi et al.
patent: 4595875 (1986-06-01), Chan et al.
patent: 4701695 (1987-10-01), Chan et al.

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