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Semiconductor memory device having burn-in test function

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having circuit for activating predet

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having circuit for activating predet

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having data input/output circuit of

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having data parallel/serial...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having error checking and correcting

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having fast writing circuit for test

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having fewer memory cell plates...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having floating gate transistors

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having I/O unit

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having internal circuit...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having monitoring function

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having multi-bit testing function

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having multiple selector unit simult

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having on-chip test circuit

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having on-chip test circuit and meth

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having on-chip test circuit and oper

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having output data buffer unit share

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having parallel test mode for...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having redundant circuit

Static information storage and retrieval – Read/write circuit – Testing
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