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Programmable data strobe offset with DLL for double data...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Programmable device and method of testing programmable device

Static information storage and retrieval – Read/write circuit – Testing
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Programmable logic device

Static information storage and retrieval – Read/write circuit – Testing
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Programmable logic device with built in self test

Static information storage and retrieval – Read/write circuit – Testing
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Programmable logic device with built in self test

Static information storage and retrieval – Read/write circuit – Testing
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Programmable read-only memory device provided with test cells

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Programmable voltage divider and method for testing the...

Static information storage and retrieval – Read/write circuit – Testing
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Programmable voltage divider and method for testing the...

Static information storage and retrieval – Read/write circuit – Testing
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Programmable weak write test mode

Static information storage and retrieval – Read/write circuit – Testing
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Programmable weak write test mode (PWWTM) bias generation...

Static information storage and retrieval – Read/write circuit – Testing
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PROM IC enabling a stricter memory cell margin test

Static information storage and retrieval – Read/write circuit – Testing
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PROM speed measuring method

Static information storage and retrieval – Read/write circuit – Testing
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PSRAM for performing write-verify-read function

Static information storage and retrieval – Read/write circuit – Testing
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Push button mode automatic pattern switching for...

Static information storage and retrieval – Read/write circuit – Testing
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