Programmable logic device with built in self test

Details Programmable logic device with built in self test Programmable logic device with built in self test

2011-05-17

2011-05-17

Nguyen, Tan T. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S185090, C365S189120

Reexamination Certificate

active

07944765

ABSTRACT:
In one embodiment of the invention, an integrated circuit such as a programmable logic device includes volatile memory, nonvolatile memory, and a data shift register for reading data from the nonvolatile memory and for reading data from and writing data to the volatile memory. A built in self test (BIST) circuit is operable to test the nonvolatile memory without the data shift register reading data from the nonvolatile memory. The BIST circuit may include a finite state machine for performing at least one of the following tests on the nonvolatile memory: bulk erase, bulk program; margin bulk program; and/or margin bulk erase. A memory controller responsive to the finite state machine is operable to write data to and read data from the nonvolatile memory during testing of the nonvolatile memory.

REFERENCES:
patent: 6961279 (2005-11-01), Simko
patent: 7630259 (2009-12-01), Han et al.

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