Damascene resistor and method for measuring the width of same

Data transfer circuit

Defect detection using liquid crystal and internal heat source

Defect inspecting method

Defect inspection apparatus and defect inspection method

Deliberate semiconductor film variation to compensate for...

Deposition rate control on wafers with varying characteristics

Deposition stop time detection apparatus and methods for...

Derived metric for monitoring die placement

Design methodology for MuGFET ESD protection devices

Design-based monitoring

Detecting die speed variations

Detecting pinholes in vertical cavity surface-emitting laser...

Detecting trace levels of copper

Detection and classification of micro-defects in...

Detection and reduction of dielectric breakdown in...

Detection of nontransient processing anomalies in vacuum...

Detection of undesired connection between conductive...

Determination of a process flow based upon fault detection...

Determination of effective oxide thickness of a plurality of...