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Selected: B

B-stageable die attach adhesives

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Back side reactive ion etch

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Backside cannelure to provide for wafer shift detection

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Backside device deprocessing of a flip-chip multi-layer...

Semiconductor device manufacturing: process – With measuring or testing
Utility Patent

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Backside IC device preparation process

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Balancing planarization of layers and the effect of...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

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Balancing planarization of layers and the effect of...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Baseplate for chip burn-in and/of testing, and method thereof

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Binning for semi-custom ASICs

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Body-tied-to-source partially depleted SOI MOSFET

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Bond surface conditioning system for improved bondability

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Bond wire tuning of RF power transistors and amplifiers

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Bonding apparatus

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Box-in-box field-to-field alignment structure

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Built-in inspection template for a printed circuit

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Burn-in method and burn-in device

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Burn-in method for microwave semiconductor transistor

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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