Color-coded mapping system and method for identifying elements i

Column for charged particle beam device

Column simultaneously focusing a particle beam and an...

Combination apparatus having a scanning electron microscope ther

Combined electron microscope

Combined scanning electron and scanning tunnelling microscope ap

Combined scanning probe and scanning energy microscope

Compact scanning electron microscope

Compact temperature-compensated tube-type scanning probe with la

Compact temperature-compensated tube-type scanning probe with la

Compact, high collection efficiency scintillator for...

Compact, integrated electron beam imaging system

Compensation circuit for use in a high resolution amplified...

Composite apparatus with secondary ion mass spectrometry instrum

Composite charge particle beam apparatus

Composite charged particle beam apparatus

Composite charged particle beam apparatus, method of...

Composite scanning tunneling microscope

Composite scanning tunneling microscope

Composite scanning tunnelling microscope with a positioning func