Back-scattered electron detector for use in an electron microsco

Backscatter apparatus and method for measuring thickness of a co

Backscatter instrument for measuring thickness of a continuously

Backscatter instrument having indexing feature for measuring coa

Backscattered-electron detection systems and associated methods

Backscattering spectrometry device for identifying unknown eleme

Balanced momentum probe holder

Balanced momentum probe holder

Barrier height measuring apparatus including a conductive cantil

Beam adjusting sample, beam adjusting method and beam...

Beam alignment in a lower column of a scanning electron...

Beam as well as method and equipment for specimen fabrication

Beam current normalization in an X-ray microanalysis instrument

Beam deflection and focusing system for a scanning corpuscular-b

Beam evaluation

Beam guiding arrangement, imaging method, electron...

Beam quality in FIB systems

Bellows with spring anti-gravity device

Bi-axial-tilting specimen fine motion device and method of corre

Bi-directional electron beam scanning apparatus