Backscatter apparatus and method for measuring thickness of a co

Details Backscatter apparatus and method for measuring thickness of a co Backscatter apparatus and method for measuring thickness of a co

1978-06-02

1980-10-21

Smith, Alfred E.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

250360, G01N 2300

Patent

active

042296528

ABSTRACT:
A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mouted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.

REFERENCES:
patent: 3621259 (1971-11-01), Boissevain
patent: 4115690 (1978-09-01), Weinstock et al.

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