Backscatter instrument having indexing feature for measuring coa

Details Backscatter instrument having indexing feature for measuring coa Backscatter instrument having indexing feature for measuring coa

1977-11-15

1980-02-26

Willis, Davis L.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

250360, G01N 2300

Patent

active

041907701

ABSTRACT:
A backscatter measurement device for measuring the thickness of a coating on elements forming a web of substrate material moving from a feed supply to a take-up location at a predetermined speed. A measurement wheel is provided, adjacent to the rim of which is mounted a backscatter probe for irradiating and detecting the backscattered radiation from a coated substrate. The web of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving web whereby the probe and an adjacent point on the web are stationary relative to one another while the point on the web is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated web. This backscatter measurement device is further provided with indexing apparatus to position automatically the probe directly adjacent an element to be measured on the web.

REFERENCES:
patent: 3019336 (1962-01-01), Johns
patent: 3519824 (1970-07-01), Weinstock et al.
patent: 4115690 (1978-09-01), Weinstock et al.

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