Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-07-11
1999-08-03
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356397, G01B 1100
Patent
active
059332395
ABSTRACT:
A scale has marks of a point-symmetrical shape which are arranged in matrix. The scale and an article to be measured in dimension are positioned without any relative movement. An image sensor unit detects a predetermined portion of the article and the marks of the scale corresponding to the predetermined portion of the article selectively and successively, and the image sensor unit generates output signals in accordance with the detected results of the article and the scale. The output signals are processed to calculate the dimension of the article.
REFERENCES:
patent: 2650518 (1953-09-01), Jaroff et al.
patent: 4172662 (1979-10-01), Vogel
patent: 4269515 (1981-05-01), Altman
patent: 4393401 (1983-07-01), Gorenflo et al.
Japan E.M. Co., Ltd.
Pham Hoa Q.
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