Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1991-09-06
1993-07-27
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, 364561, G01B 1104
Patent
active
052314707
ABSTRACT:
A scanning system for a three-dimensional object digitizing system comprises circuitry for directing a set of sequential light beams to a plurality of points on an object. The light beams are directed by the normalizing circuitry to be normal to the surface of the object at the point of incidence. With this orientation, the scanning system associates with the ranging system for the determination of a set of a range measurements to the points on the object. Circuitry of the scanning system predicts the location of a point on the surface as a function of a plurality of previously measured points. Additional circuitry adaptively pivots the light beams away from the normal incidence angle to reach a plurality of points in response to a measurement substantially deviating from the predicted point. The scanning system redirects subsequent light beams to be incident on the surface upon the occurrence of a predetermined set of conditions and continues to provide normal incidence angles and pivoting incidence angles for points around the contour of the object being scanned.
REFERENCES:
patent: 5094538 (1992-03-01), Reedman et al.
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