Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1989-12-19
1991-02-12
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356378, G01B 1122
Patent
active
049919679
ABSTRACT:
A scratch depth measuring instrument (10) for use on opaque matte or specular surfaces (80) includes a light source (16), a body (40) having a knife edge (38). The light source is positioned to project a shadow pattern of the knife edge and to image it on a scratched surface (80) transversely to a scratch (82) for measuring the scratch depth and to project a visible indentation (132, 132A) from the knife edge (38) into the scratch (82). The indentation can be measured in distance from the knife edge image (92, 92A) to determine the depth of the scratch. The knife edge image (92, 92A) is projected to the surface (80) from a first mirror (62) and a mirror system (98, 100) reflects the image (92, 92A) and the measurable indentation (132, 132A). A microscope (74) has an eyepiece (124) for viewing a reflected image (92, 92A) and indentation (132, 132A) and a reticle (72) in the microscope is read for measuring the indentation (132, 132A) from the knife edge image (92, 92A) to determine the depth of the scratch (82).
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Heberer Eugene O.
Pauly Joan H.
Rosenberger Richard A.
The Boeing Company
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