Scratch depth measuring instrument and method

Optics: measuring and testing – By polarized light examination – With light attenuation

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356378, G01B 1122

Patent

active

049919679

ABSTRACT:
A scratch depth measuring instrument (10) for use on opaque matte or specular surfaces (80) includes a light source (16), a body (40) having a knife edge (38). The light source is positioned to project a shadow pattern of the knife edge and to image it on a scratched surface (80) transversely to a scratch (82) for measuring the scratch depth and to project a visible indentation (132, 132A) from the knife edge (38) into the scratch (82). The indentation can be measured in distance from the knife edge image (92, 92A) to determine the depth of the scratch. The knife edge image (92, 92A) is projected to the surface (80) from a first mirror (62) and a mirror system (98, 100) reflects the image (92, 92A) and the measurable indentation (132, 132A). A microscope (74) has an eyepiece (124) for viewing a reflected image (92, 92A) and indentation (132, 132A) and a reticle (72) in the microscope is read for measuring the indentation (132, 132A) from the knife edge image (92, 92A) to determine the depth of the scratch (82).

REFERENCES:
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Spitta, E. J., Microscopy, The Construction, Theory and Use of the Microscope, John Murray, London, 1907, pp. 34 & 36.
Naegeli et al., The Microscope in Theory and Practice, Swan, Sonnenschein, Lowrey & Co., London, 1887.
Tolanski, S., "A Topographic Microscope, " Scientific American, Aug. 1954, pp. 54-59.
Saur, R., "Topographic Microscope", Review of Scientific Instruments, vol. 29, No. 11 (Nov. 1958), pp. 1023-1026.

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