Sample entry purge system in spectrophotometer,...

Details Sample entry purge system in spectrophotometer,... Sample entry purge system in spectrophotometer,...

2007-09-25

2007-09-25

Punnoose, Roy M. (Department: 2886)

Optics: measuring and testing

By polarized light examination

Of surface reflection

C356S244000

Reexamination Certificate

active

10857774

ABSTRACT:
A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from within the generally enclosed space into the subspace discourage atmospheric contaminates from entering into the subspace. Contained within the generally enclosed space is a spectrophotometer, ellipsometer or polarimeter or the like system which operates at wavelengths, (eg. UV), which are adversely affected, (eg. absorbed), by typical atmospheric contents.

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