Sample investigating system

Details Sample investigating system Sample investigating system

2006-06-14

2009-11-24

Punnoose, Roy (Department: 2886)

Optics: measuring and testing

By polarized light examination

Of surface reflection

Reexamination Certificate

active

07623237

ABSTRACT:
A spectroscopic system for adjusting spacing between an adjacent source/detector as a unit, and a sample, and a reflecting means for directing an incident beam which reflects from said sample back onto said sample and then into the detector along a locus which is in a plane of incidence that is offset from that of the incident beam, or directly from the reflecting means into the detector, including means for reducing reflections of a beam of electromagnetic from the back of a sample, including methodology of use.

REFERENCES:
patent: 5608526 (1997-03-01), Piwonka-Corle et al.
patent: 5929993 (1999-07-01), Johs
patent: 5963327 (1999-10-01), He et al.

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