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System for remotely reading an analog meter

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for scatterometric measurements and applications

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for simultaneously measuring thin film layer...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for three-dimensional measurement of inaccessible hollow

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for verifying the calibration of a turbidimeter

Optics: measuring and testing – By polarized light examination
Patent

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System to protect optics against dirty environments

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System utilizing an achromatic null lens for correcting aberrati

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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System, and mathematical regression-based method utilizing optic

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Systems and methods for analyzing dew in a system of interest

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Systems and methods for analyzing dew in a system of interest

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Systems and methods for calibrating laser ablations

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Systems and methods for limiting power using photo-induced...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Systems and methods for measurement of a specimen with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Systems and methods for optical measurement

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Systems for measuring periodic structures

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Systems, methods, and devices for handling terahertz radiation

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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