Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1999-05-10
2000-10-03
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
25055922, 250342, G01B 1104, G01J 100
Patent
active
061280860
ABSTRACT:
A scanning arrangement comprising means (40) for projecting a two-dimensional optical pattern on a surface (35) of a scanned object and a two-dimensional photodetector (34') is mounted within a hand-held scanning device and outputs scan files of 3D coordinate data of overlapping surface portions of the object. The surface portions defined by these scan files are registered by appropriate rotations and translations in a computer, which are determined either from the outputs of a gyroscope (51) and an accelerometer (50) or by mathematical processing of the surface portions e.g. involving detection and location of common features.
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Flockhart Christopher Peter
Fowler Guy Richard John
Pham Hoa Q.
Tricorder Technology plc
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