Method for monitoring the rate of etching of a semiconductor

Method for optically testing semiconductor devices

Method for optically testing semiconductor devices

Method for processing low coherence interferometric data

Method for scanning optical interference patterns with line...

Method for self-calibrated sub-aperture stitching for...

Method for the contactless measurement of three-dimensional...

Method for the interferometric measurement of...

Method for the interferometric measurement of...

Method for vibration measurement and interferometer

Method of aligning optical system using a hologram and...

Method of and apparatus for measuring thickness of thin film...

Method of assessing bond integrity in bonded structures

Method of assisting sample inclination error adjustment

Method of calculating two-dimensional wavefront aberration

Method of calculating two-dimensional wavefront aberration

Method of calibrating an interferometer optics and method of...

Method of calibrating an interferometer optics and of...

Method of characterization of liquid crystal cell

Method of characterizing transparent thin-films using...