Method for self-calibrated sub-aperture stitching for...

Details Method for self-calibrated sub-aperture stitching for... Method for self-calibrated sub-aperture stitching for...

2005-10-18

2005-10-18

Lee, Andrew H. (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

Reexamination Certificate

active

06956657

ABSTRACT:
A method for accurately synthesizing a full-aperture data map from a series of overlapped sub-aperture data maps. In addition to conventional alignment uncertainties, a generalized compensation framework corrects a variety of errors, including compensators that are independent in each sub-aperture. Another class of compensators (interlocked) include coefficients that are the same across all the sub-apertures. A constrained least-squares optimization routine maximizes data consistency in sub-aperture overlap regions. The stitching algorithm includes constraints representative of the accuracies of the hardware to ensure that the results are within meaningful bounds. The constraints also enable the computation of estimates of uncertainties in the final results. The method therefore automatically calibrates the system, provides a full-aperture surface map, and an estimate of residual uncertainties. Therefore, larger surfaces can be tested with greater departures from a best-fit sphere to greater accuracy than was possible in the prior art.

REFERENCES:
patent: 5960379 (1999-09-01), Shimizu et al.
patent: 5986668 (1999-11-01), Szeliski et al.
patent: 5987189 (1999-11-01), Schmucker et al.
patent: 6097854 (2000-08-01), Szeliski et al.
patent: 6611791 (2003-08-01), Kase et al.

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