Data age adjustments

Depth-resolved spectroscopic optical coherence tomography

Detection of film thickness through induced acoustic...

Determination of lithography misalignment based on curvature...

Determination of thin film topography

Determining endpoint in a substrate process

Determining endpoint in a substrate process

Determining thickness of slabs of materials by inventors

Device and method for a combined interferometry and...

Device and method for the determination of imaging errors...

Device and method for the interferometric measurement of...

Device and method for the optical measurement of an optical...

Device and method for wavefront measurement of an optical...

Device and method for wavefront measurement of an optical...

Device for determining the position of at least one...

Device for determining the position of spaced-apart areas in...

Device for high-accuracy measurement of dimensional changes

Device for measuring the position of at least one structure...

Device for measuring translation, rotation or velocity via...

Device for measuring translation, rotation or velocity via...