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Imaging optical system configured with through the lens...

Optics: measuring and testing – By light interference – For dimensional measurement
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Imaging optical system for oblique incidence interferometer

Optics: measuring and testing – By light interference – For dimensional measurement
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Imaging system with low coherence light source

Optics: measuring and testing – By light interference – For dimensional measurement
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In situ determination of pixel mapping in interferometry

Optics: measuring and testing – By light interference – For dimensional measurement
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In SITU measurement and compensation of errors due to...

Optics: measuring and testing – By light interference – For dimensional measurement
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In-situ critical dimension measurement

Optics: measuring and testing – By light interference – For dimensional measurement
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In-situ film thickness measurement using spectral...

Optics: measuring and testing – By light interference – For dimensional measurement
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In-situ metrology system and method

Optics: measuring and testing – By light interference – For dimensional measurement
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Infrared scanning interferometry apparatus and method

Optics: measuring and testing – By light interference – For dimensional measurement
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Inspection system calibration methods

Optics: measuring and testing – By light interference – For dimensional measurement
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Integrated interference scanning method

Optics: measuring and testing – By light interference – For dimensional measurement
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Integrated plane mirror and differential plane mirror...

Optics: measuring and testing – By light interference – For dimensional measurement
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Integrated scanning and ocular tomography system and method

Optics: measuring and testing – By light interference – For dimensional measurement
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Interference measurement apparatus, interference measurement pro

Optics: measuring and testing – By light interference – For dimensional measurement
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Interference system and semiconductor exposure apparatus...

Optics: measuring and testing – By light interference – For dimensional measurement
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Interference system and semiconductor exposure apparatus...

Optics: measuring and testing – By light interference – For dimensional measurement
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Interference-type distance measuring device

Optics: measuring and testing – By light interference – For dimensional measurement
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Interferential position measuring arrangement

Optics: measuring and testing – By light interference – For dimensional measurement
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Interferometer and interferance measurement method

Optics: measuring and testing – By light interference – For dimensional measurement
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Interferometer and interferance measurement method

Optics: measuring and testing – By light interference – For dimensional measurement
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