LandOfFree - US Patents - Listing for Optics: measuring and testing,By light interference,For dimensional measurement

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Height scanning interferometer for determining the absolute...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Height scanning interferometry method and apparatus...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Heterodyne laser interferometer for measuring wafer stage...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Heterodyne reflectometer for film thickness monitoring and...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Heterodyne reflectometer for film thickness monitoring and...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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High precision interferometer apparatus employing a grating...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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High resolution non-contact interior profilometer

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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High sensitivity scanning probe system

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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High-definition vertical-scan interferometry

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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High-speed optical delay generating method by rotation...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Highly-sensitive displacement-measuring optical device

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Homodyne laser interferometer probe and displacement...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Hybrid curvature-tilt wave front sensor

Optics: measuring and testing – By light interference – For dimensional measurement

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