Method for the interferometric measurement of...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Reexamination Certificate

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10931703

ABSTRACT:
The method serves for the interferometric measurement of non-rotationally symmetric wavefront errors on a specimen . The specimen is brought into a number of rotational positions, at least one measurement result being determined in each of the rotational positions and a mathematical evaluation of all measurement results is performed. The measurement results (M1. . . Mm; N1. . . Nn) of each of the measurement series (M, N) are determined respectively in mutually equidistant rotational positions of the specimen . The measurement results (M1. . . Mm, N1. . . Nn) of each of the at least two measurement series (M, N) are evaluated independently of one another for non-rotationally symmetric wavefront errors (<W>m, <W>n) on the specimen, and a difference is computationally rotated m or n times and the results averaged out. At least one of the wavefront errors (<W>m, <W>n) is corrected with the result (<<W>m-<W>n>mor <<W>m-<W>n>n) averaged in this way.

REFERENCES:
patent: 5982490 (1999-11-01), Ichikawa et al.
patent: 6839143 (2005-01-01), Otto
patent: 8233552 (1996-09-01), None
Calibration of symmetric and non-symmetric errors for interferometry of ultra-precise imaging systems, Phillion et al, proceedings of the SPIE, vol. 5869, pp. 1-12.
Evans et al.; “Test optics error removal,”Applied Optics, vol. 25 (7) pp. 1015-1021, Mar. 1, 1996.
Fritz, Bernard S.; “Absolute calibration of an optical flat,”Optical Engineering, vol. 23 (4) pp. 379-383, Jul./Aug. 1984.
Schulz et al.; “Absolute flatness testing by the rotation method with optimal measuring-error compensation,” vol. 31 (19) pp. 3767-3780, Jul. 1, 1993.
Freimann et al.; “Absolute measurement of no-comatic aspheric surface errors,”Optics Communications, 161 (1999) pp. 106-114.

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