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Optical extensometer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical film thickness measurement method, film formation method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical gaging system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical gaging system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical inspection system based on spatial filtering using a...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Optical inspection system for cylindrical objects

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical inspection system for large parts and for multiple measu

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical inspection system for solder joints and inspection metho

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Optical measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical measurement device and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical measuring apparatus and measuring method of the same

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Patent

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Optical measuring device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical measuring machine with detachable operating board

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical measuring method and an optical measuring apparatus for

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical measuring system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical method and apparatus for measuring surface topography of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Optical method for detecting errors in shape

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Optical micrometer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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