Optical inspection system for large parts and for multiple measu

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356394, 250227, G01B 1102, G01B 1100

Patent

active

042795133

ABSTRACT:
An optical-electronic measurement system wherein only the images of workpiece edges from which measurements are to be taken are coupled to identifiable locations on the photocathode of a processor-controlled scanner by a plurality of flexible fiber optic bundles whose object ends are placed about an inspection field so that each such edge is within the field of view of a respective bundle. Pairs of such identifiable locations are correlated to the measurements to be taken. A workpiece of known size is placed in the inspection field and the scanner photocathode is electronically scanned to determine the positions of the edge images relative to scan origins. The processor adjusts functions to relate the edge positions correctly to the known dimensions. The same measurements of workpieces of unknown dimensions are then taken by the calibrated system using the adjusted functions.

REFERENCES:
patent: 1997417 (1935-04-01), Hand
patent: 2484103 (1949-10-01), Lewis
patent: 2674917 (1954-04-01), Summerhayes, Jr.
patent: 2759602 (1956-08-01), Baigent
patent: 3217589 (1965-11-01), Chitayat
patent: 3265892 (1966-08-01), Sheldon
patent: 3311749 (1967-03-01), Briggs
patent: 3365699 (1968-01-01), Foster
patent: 3437022 (1969-04-01), Hamonds, Jr.
patent: 3529169 (1970-09-01), Heaney et al.
patent: 3694658 (1972-09-01), Watson et al.
patent: 3724958 (1973-04-01), Callan
patent: 3761723 (1973-09-01), De Cock
patent: 3902811 (1975-09-01), Altman et al.
patent: 3992107 (1976-11-01), Loy
patent: 4002919 (1977-01-01), Linard
patent: 4041321 (1977-08-01), Linard
Echelmeier, "Edge and Width Evaluation," IBM Tech. Disc. Bull., vol. 16, No. 3, Aug. 1973, p. 975.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical inspection system for large parts and for multiple measu does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical inspection system for large parts and for multiple measu, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical inspection system for large parts and for multiple measu will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2432686

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.