Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1995-05-01
1997-06-03
Pham, Hoa Q.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356376, 356387, 359201, 359226, G01B 1110, G02B 2608
Patent
active
056360304
ABSTRACT:
An optical method and apparatus are disclosed for determining characteristics of an object such as its size, shape, position, orientation, cross-sectional area, volume, surface topography and specific volume. The inventive method and apparatus utilize a laser beam which is reflected through a right angle by a multi-faceted mirror. The mirror rotates about its own axis as it orbits around the object to be measured, causing a plurality of rotary scanning beams to sweep inwardly across the object as the mirror orbits. Portions of the scanning beam that are not blocked by the object strike a retroreflective ring positioned around the object and are returned along the beam's incident path to a detector. By associating the corresponding orbital position and rotational orientation of the mirror with the detector signal each time a shadow is created by the object, tangents to the surface of the object can be calculated. The tangents gathered during each orbit can then be assimilated to determine the cross-section of the object in the plane of the mirror's orbit. Changing the relative longitudinal position between the orbiting mirror and the object allows successive cross-sections to be determined and combined to calculate the total surface topography or volume of the object.
REFERENCES:
patent: 3765774 (1973-10-01), Petrohilos
patent: 3879615 (1975-04-01), Moser
patent: 3880289 (1975-04-01), Gray
patent: 3905705 (1975-09-01), Petrohilos
patent: 4192613 (1980-03-01), Hammar
patent: 4198165 (1980-04-01), Kirchstein
patent: 4406544 (1983-09-01), Takada et al.
patent: 4417817 (1983-11-01), Bohme et al.
patent: 4465937 (1984-08-01), Forbes
patent: 4679076 (1987-07-01), Vikterlof et al.
patent: 4693607 (1987-09-01), Conway
patent: 4705401 (1987-11-01), Addleman et al.
patent: 4737032 (1988-04-01), Addleman et al.
patent: 4877970 (1989-10-01), Minamikawa et al.
patent: 4905512 (1990-03-01), Hayashi
patent: 4906098 (1990-03-01), Thomas et al.
patent: 5072121 (1991-12-01), Jazbec
patent: 5142159 (1992-08-01), Veit et al.
patent: 5251013 (1993-10-01), Danielson et al.
patent: 5457537 (1995-10-01), Richter
patent: 5477371 (1995-12-01), Shajir
LandOfFree
Optical method and apparatus for measuring surface topography of does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical method and apparatus for measuring surface topography of, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical method and apparatus for measuring surface topography of will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-395311