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Method and apparatus for measuring the monocrystal diameter and

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for measuring the thickness of a film using

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for measuring the thickness of a thin film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for measuring the wall thickness of transpa

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for measuring thickness of a film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for measuring thickness of thin films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for measuring width of a selvage rubber por

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for monitoring layer erosion in a dry-etchi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for monitoring the deposition rate of films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for non-contact determination of run-out of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for non-contact measurement of relative dis

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Method and apparatus for optical inspection of substrates

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for optical inspection of substrates

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reissue Patent

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Method and apparatus for optical measurement of the dimension of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for optically checking an electrical compon

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for optically measuring the volume of gener

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for pattern detection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Method and apparatus for production line screening

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and apparatus for quality inspection or molded of formed

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Method and apparatus for real-time, in-situ endpoint detection a

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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