Method and apparatus for measuring thickness of a film

Details Method and apparatus for measuring thickness of a film Method and apparatus for measuring thickness of a film

1982-12-14

1986-11-18

Rosenberger, R. A.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

G01B 1106

Patent

active

046232540

ABSTRACT:
A beam of light generated by a light source is separately applied to a measured film having unknown thickness and a reference film having a known thickness. The light transmitted through the measured film and the reference film are converted into electric signals which are electrically processed by a logarithmic operation circuit so as to produce a specific electric signal proportional to the difference between the thickness of the measured film and the reference film.

REFERENCES:
patent: 2517330 (1950-08-01), Marenholtz
patent: 2549402 (1951-04-01), Vossberg
patent: 3732016 (1973-05-01), Deshayes et al.
patent: 3761724 (1973-09-01), Dennis
patent: 3807876 (1974-04-01), Nakahara et al.
patent: 4092069 (1978-05-01), Fukuda et al.
patent: 4248536 (1981-02-01), Hijikata
Donohoe, "Measuring the Thickness of Plastic Films", NASA Tech. Briefs, vol. 4, No. 1, (Spring 1979), p. 100.

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