Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1993-02-02
1995-07-04
Limanek, Robert P.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356357, 356350, 250548, G01N 2101, G01N 2115
Patent
active
054305489
ABSTRACT:
The inventive pattern detection method and apparatus produce, from an optical image of a pattern in attention and an optical image of a pattern which should be identical to the pattern in attention, an optical image by merging the images, with a relative phase shift being imposed, and pattern information is detected or observed in the merged optical image or a signal produced from the optical image through the conversion with an opto-electric transducer means.
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Hiroi Takashi
Isobe Mitsunobu
Kubota Hitoshi
Maeda Shunji
Makihira Hiroshi
Hitachi , Ltd.
Limanek Robert P.
Williams Alexander Oscar
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