Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1995-10-10
1998-05-05
Pham, Hoa Q.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 250223R, G01B 1100
Patent
active
057483221
ABSTRACT:
A method and an apparatus for conducting quality inspection of molded/formed articles (2) produced in a molding or forming machine which enables automation of the inspection by sensing surface coordinates using an optical triangulation sensor moved along a suitable sensing path (5), wherein spatial coordinate values of the surface of the article (2) obtained in the course of the movement of the sensor along the sensing path (5) are used to generate actual dimensional parameters which are compared with dimensional parameters determined for the prescribed desired dimensional form of the article, and the quality of the article (2) is evaluated based on the results of the comparisons.
REFERENCES:
patent: 4095925 (1978-06-01), Cruzen et al.
patent: 4541722 (1985-09-01), Jenks
patent: 5129010 (1992-07-01), Higuchi et al.
patent: 5305080 (1994-04-01), Lee et al.
Konder Wolfgang
Wollscheid Heinz-Peter
Laeis + Bucher GmbH
Pham Hoa Q.
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