Temperature-compensated laser measuring method and apparatus

Details Temperature-compensated laser measuring method and apparatus Temperature-compensated laser measuring method and apparatus

1996-03-08

1997-07-22

Pham, Hoa Q.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

33702, G01B 1102

Patent

active

056508522

ABSTRACT:
A temperature-compensated laser measuring method and apparatus for determining the dimensions of long parts is disclosed. Parts to be measured are positioned along a y-axis fence (19) against an x-axis fence (21). A gantry (15) is moved along a precision support rail (17) to the desired longitudinal (x-axis) position. Then a probe (23) is moved inwardly or outwardly to a desired y-axis position and lowered to a desired z-axis position. A Doppler laser measuring system that includes a Doppler laser head (25) and retroreflector (27) measures x-axis length. Y-axis and z-axis encoders (29, 31) determine y-axis and z-axis probe position with respect to the y-axis fence and the top (39) of the table (13). A temperature compensation unit (103) receives the laser measurement information and modifies the x-axis length measurement based on part temperature and the coefficient of expansion of the part. A display system (33) receives all of the position and measurement information and displays length, width, and height dimensions.

REFERENCES:
patent: 3698817 (1972-10-01), Iimura et al.
patent: 3930730 (1976-01-01), Laurens et al.
patent: 4922307 (1990-05-01), Schaffer
patent: 4928019 (1990-05-01), Tomikawa et al.

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