Testing method for subjects to be tested and a device for said m

Details Testing method for subjects to be tested and a device for said m Testing method for subjects to be tested and a device for said m

1983-02-02

1986-03-25

Rosenberger, R. A.

Optics: measuring and testing

By configuration comparison

With comparison to master, desired shape, or reference voltage

356426, 356427, G01B 1100

Patent

active

045779694

ABSTRACT:
When a plural number of subjects to be tested are continuously and sequentially measured, and the values obtained by measurement are compared with a standard value for judgement, a prescribed number of newly inputted measured values are sequentially stored, a mean value is computed basing upon stored values for determining the standard value for judgement, and the measured values are compared with the standard value for judgement for judging whether these measured values are to be employed or not. Whenever new measured values are inputted, a new standard value is determined. If there is a value for an inferior subject among newly inputted measured values, the value is omitted from computation of the standard value for judgement.

REFERENCES:
patent: 3777169 (1973-12-01), Walter et al.
patent: 3961898 (1976-06-01), Neeley et al.
patent: 4029416 (1977-06-01), Hawes
patent: 4257709 (1981-03-01), Mostyn, Jr.

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