Coating thickness measurement system and method of measuring a c

Details Coating thickness measurement system and method of measuring a c Coating thickness measurement system and method of measuring a c

1998-10-13

2000-04-18

Kim, Robert H.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356372, 356382, G01B 1106

Patent

active

060521910

ABSTRACT:
A coating thickness measurement system (10) for measuring a thickness of a coating (12) on a coated substrate (14) is provided. The coating thickness measurement system (10) may comprise a light source (16), a detector system (18), and a processor (20). The light source (16) directs a light beam (22) at an angle (26) oblique to an axis (28) of the coating (12). The light beam (22) striking the coating (12) produces a reflected light beam (36). The detector system (18) measures a reflectivity of the coating (12). The processor (20) receives the reflectivity measurement and determines the reflectivity of the coating (12). The thickness of the coating (12) is determined from the reflectivity of the coating (12).

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