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Method for the characterization of lacquer coated plastic surfac

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for ascertaining the diameters of rod-sh

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for determining optical quality of an ar

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for forming multi-layer film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for inspecting residue of metal film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of and apparatus for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method of and apparatus for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of establishing a measuring point for determining the thi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of examining microcircuit patterns

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of fabricating gradient index optical films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of inspecting the pattern on a photographic mask

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of measuring film thicknesses

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of measuring orientation flat width of single crystal ing

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of measuring the dimensions of moving objects

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of recognizing cylindrical part

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method of using scatterometry measurements to determine and...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Methods and apparatus for detecting removal of thin film layers

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Methods of and apparatus for measuring surface areas

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Micro-dimensional measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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