4. Optics: measuring and testing
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Far-field characterization of sub-wavelength sized apertures

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Ferroelectric length measuring and moving target transducer with

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Fiber length analyzer

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Fiber optic imaging system for on-line monitoring

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Fiber optic imaging system for on-line monitoring

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness detector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness measurement of structures containing a scattering

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness measuring apparatus employing intensity compensat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness measuring apparatus employing microprojector of s

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness measuring device and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness-measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness-measuring apparatus using linearly polarized ligh

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Finish meter for detecting and measuring a metal oxide coating t

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Follow-up system for etch process monitoring

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Food sorting by reflection of periodically scanned laser beam

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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