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Depositing a material of controlled, variable thickness...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Detector pulse enhancement circuit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Determination of dimensions of tubes

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Determination of refractive index and thickness of thin layers

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device and method for end-point monitoring used in the polishing

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device and method for observing and analyzing a stream of materi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for contact-free thickness measurement

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for continuously measuring a transverse dimension of a th

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for improving the accuracy of optical measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for measuring a transverse dimension of a thread-like str

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for measuring dimensions of workpieces

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for measuring height of object

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for measuring ink film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for measuring the thickness of thin films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for measuring the transverse dimension of a thread

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for monitoring characteristics of a film on a substrate

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for optical measurement of width/thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device/process for contact free distance and thickness measureme

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Dichotomous scan system for detection of edges of objects and ov

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Dichotomous scan system for detection of edges of objects and ov

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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