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Adaptor for measuring length optically for endoscope

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for determining depth profile characteristi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for determining the thickness of insulated

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for dimensional weighing utilizing a mirror

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for dimensional weighing utilizing a rotati

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for measuring an object

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for measuring the thickness of a semiconduc

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for optical control of the profile of a bod

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for performing high spatial resolution thin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for performing thin film layer thickness me

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method for real-time measurement of thin film laye

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and method to measure and monitor the coating of objec

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and process for automatically measuring aperture size

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and process for measuring the unroundness and...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Apparatus and system for linewidth measurements

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus and system for linewidth measurements

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus for detecting image area of thin plate

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus for detecting irregularities in the diameter of a fila

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus for determining the thickness of an optical sample

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Apparatus for making contactless measurements of the thickness o

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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