Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1981-05-07
1983-09-27
Punter, William H.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356 51, 356445, 356446, G01B 1128, G01N 2147, G01N 2155
Patent
active
044065450
ABSTRACT:
A technique for identifying and measuring a first surface area and apparatus for aiding such identification are disclosed. Each incremental portion of said first surface area and at least adjacent portions of surrounding surface areas are illuminated with diffuse light incident through a predetermined sectorial angle related to an anticipated waviness of the surface areas. The first surface area so illuminated is then measured by opto-electronic measuring techniques whereby measuring errors caused by shadow effects due to waviness in the surfaces are minimized by substantially uniform light dispersion within the sectorial angle.
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Montone Liber J.
Yokitis Joseph E.
Punter William H.
Schellin W. O.
Western Electric Company Inc.
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