4. Optics: measuring and testing
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Calibration method for printing plate picture pattern area meter

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Cluster tool layer thickness measurement apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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CMP variable angle in situ sensor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Coating thickness measurement system and method of measuring a c

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Computerized micromeasuring system and method therefor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contact-free optical linear measurement device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contactless thickness measuring apparatus and measuring method f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contour detecting and dimension measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Cross-sectional area measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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